nsc national semiconductor | itt corporation |
glenair inc | texas instruments |
keystone electronics | kobiconn |
other | vishay dale electronics |
harwin plc |
Part No | Manufacturer | Description | QTY | RFQ |
---|---|---|---|---|
DS26F32MWGRQMLV | nsc national semiconductor | quad differential line receivers also available guaranteed to 100k rad(si) tested to mil-std-883, method 1019.5, condition a | Avl | RFQ |
B114LPBT | itt corporation | remote test coil kit for use | Avl | RFQ |
MNDS26F32MJR-QML | nsc national semiconductor | quad differential line receivers also available guaranteed to 100k rad(si) tested to mil-std-883, method 1019.5, condition a | Avl | RFQ |
OTU-8000 | itt corporation | optical test unit | Avl | RFQ |
NI5153 | itt corporation | high-speed digitizers-optimized for automated test | Avl | RFQ |
ABC54705-HA | glenair inc | fiber optic test probe | Avl | RFQ |
GTK1000-A-B | glenair inc | fiber optic testing kit | Avl | RFQ |
SN74ABT18504PMG4 | texas instruments | scan test devices with 20-bit universal bus transceivers | Avl | RFQ |
11002 | keystone electronics | test points wh test point jack .283 x .120, .142 d ptfe insulated test jack; jack to turret; available in white, red or black insulator bushing | Avl | RFQ |
GTK1000-B-A | glenair inc | fiber optic testing kit | Avl | RFQ |
C1320-21-03 | itt corporation | hook-up wire, pvc test lead, no. of conductors: 1, gauge size (awg): 18 | Avl | RFQ |
SN74ABT8652DW | texas instruments | scan test devices with octal bus transceivers and registers | Avl | RFQ |
SN54BCT8245A | texas instruments | scan test devices with octal bus transceivers | Avl | RFQ |
C4000-VOIP-CISCO | itt corporation | t-berd«/mts-4000multiple services test platform | Avl | RFQ |
DS26F32MER-QML | nsc national semiconductor | quad differential line receivers also available guaranteed to 100k rad(si) tested to mil-std-883, method 1019.5, condition a | Avl | RFQ |
OFI-20 | itt corporation | ofi-2000 multifunction loss test set | Avl | RFQ |
SN54BCT8374A-08 | texas instruments | scan test devices with octal d-type edge-triggered flip-flops | Avl | RFQ |
ABC54705-CC | glenair inc | fiber optic test probe | Avl | RFQ |
GTK1000-C-A | glenair inc | fiber optic testing kit | Avl | RFQ |
ABC54705-AC | glenair inc | fiber optic test probe | Avl | RFQ |
MNLMH6628-X-RH | nsc national semiconductor | dual wideband, low-noise, voltage feedback op amp, guaranteed to 300k rd (si) tested to mil-std-883, method 1019 | Avl | RFQ |
LMH6628WGFQML | nsc national semiconductor | dual wideband, low-noise, voltage feedback op amp, guaranteed to 300k rd (si) tested to mil-std-883, method 1019 | Avl | RFQ |
SN74ABT8245DWE4 | texas instruments | scan test devices with octal bus transceivers | Avl | RFQ |
ABC54705-HF | glenair inc | fiber optic test probe | Avl | RFQ |
ADC12451CMJ | nsc national semiconductor | dynamically-tested self-calibrating 12-bit plus sign a/d converter with sample-and-hold | Avl | RFQ |
ABC54705-CB | glenair inc | fiber optic test probe | Avl | RFQ |
ABC54705-DF | glenair inc | fiber optic test probe | Avl | RFQ |
ABC54705-CF | glenair inc | fiber optic test probe | Avl | RFQ |
GTK1000-B-E | glenair inc | fiber optic testing kit | Avl | RFQ |
GTK1000-D-C | glenair inc | fiber optic testing kit | Avl | RFQ |
151-203-RC | kobiconn | test points sm blk term test points sm blk term | Avl | RFQ |
11011 | keystone electronics | test points wh test point jack .430 x .150, .218 d ptfe insulated test point jacks; horizontal entry; available in white, red or black insulator bushin | Avl | RFQ |
GTK1000-A-A | glenair inc | fiber optic testing kit | Avl | RFQ |
ADC12441 | nsc national semiconductor | dynamically-tested self-calibrating 12-bit plus sign a/d converter with sample-and-hold | Avl | RFQ |
151-108 | kobiconn | test points lg green term | Avl | RFQ |
GTK1000-F-E | glenair inc | fiber optic testing kit | Avl | RFQ |
CBM1180 | other | fastest & securest usb 2.0/usb1.1 flash disk controller with dedicated 32-bit microprocessor | Avl | RFQ |
SN54ACT8990 | texas instruments | test-bus controllers ieee std 1149.1 jtag tap masters with 16-bit generic host interfaces | Avl | RFQ |
TLWR9922 | itt corporation | telux / utilizing one of the worldæs brightest (as) allngap technologies (oma) / high luminous flux | Avl | RFQ |
GTK1000-D-B | glenair inc | fiber optic testing kit | Avl | RFQ |
MNLM136A-2-5-X-RH | nsc national semiconductor | 2.5v reference diode, guaranteed to 100k rad(si) tested to mil-std-883, method 1019.5 | Avl | RFQ |
SN54ABTH18652AHV | texas instruments | scan test devices with 18-bit bus transceivers and registers | Avl | RFQ |
GTK1000-A-C | glenair inc | fiber optic testing kit | Avl | RFQ |
GTK1000-E-B | glenair inc | fiber optic testing kit | Avl | RFQ |
C4000-VOIP | itt corporation | t-berd«/mts-4000multiple services test platform | Avl | RFQ |
ABC54705-ED | glenair inc | fiber optic test probe | Avl | RFQ |
ABC54705-FD | glenair inc | fiber optic test probe | Avl | RFQ |
ABC54705-FC | glenair inc | fiber optic test probe | Avl | RFQ |
AN-9033 | itt corporation | spmö test board for use in isolated inverter gnd | Avl | RFQ |
SN54LVTH18504A | texas instruments | 3.3-v abt scan test devices with 20-bit universal bus transceivers | Avl | RFQ |
TB502-3X-520-XX | itt corporation | test board for chip evaluation and layout recommendations | Avl | RFQ |
SN74ABTH182646A | texas instruments | scan test devices with 18-bit transceivers and registers | Avl | RFQ |
ABC54705-DC | glenair inc | fiber optic test probe | Avl | RFQ |
ABC54705-BD | glenair inc | fiber optic test probe | Avl | RFQ |
ABC54705-AF | glenair inc | fiber optic test probe | Avl | RFQ |
ABC54705-GE | glenair inc | fiber optic test probe | Avl | RFQ |
ABC54705-HC | glenair inc | fiber optic test probe | Avl | RFQ |
bq25040DQCR | texas instruments | 1.1a, single-input, single cell li-ion battery charger with 50ma ldo and 2.3a production test support | Avl | RFQ |
LP55271TLX | nsc national semiconductor | tiny led driver for camera flash and 4 leds with i2c programmability, connectivity test and audio synchronization | Avl | RFQ |
SIR880DP | vishay dale electronics | n-channel 80 v (d-s) mosfet 100 % uis tested | Avl | RFQ |
SN74ABT18245ADGGR | texas instruments | scan test devices with 18-bit bus transceivers | Avl | RFQ |
TB1210J | other | test board accelerometers | Avl | RFQ |
ABC54705-AB | glenair inc | fiber optic test probe | Avl | RFQ |
ABT18502 | texas instruments | scan test device with 18-bit registered bus transceiver | Avl | RFQ |
ABC54705-DA | glenair inc | fiber optic test probe | Avl | RFQ |
SN74BCT8244A | texas instruments | scan test devices with octal buffers | Avl | RFQ |
ABC54705-CE | glenair inc | fiber optic test probe | Avl | RFQ |
ABC54705-GB | glenair inc | fiber optic test probe | Avl | RFQ |
GTK1000-B-C | glenair inc | fiber optic testing kit | Avl | RFQ |
ABC54705-BA | glenair inc | fiber optic test probe | Avl | RFQ |
S1751-06 | harwin plc | test points smt test terminal | Avl | RFQ |
ABC54705-GA | glenair inc | fiber optic test probe | Avl | RFQ |
11005 | keystone electronics | test points wh test point jack .301 x .105, .218 d ptfe insulated test jack; jack to turret; available in white, red or black insulator bushing | Avl | RFQ |
ABC54705-EA | glenair inc | fiber optic test probe | Avl | RFQ |
GET-30569 | itt corporation | qualification test results on ne272 ser es | Avl | RFQ |
LP55271 | nsc national semiconductor | tiny led driver for camera flash and 4 leds with i2c programmability, connectivity test and audio synchronization | Avl | RFQ |
MNDS26F32MWGRQMLV | nsc national semiconductor | quad differential line receivers also available guaranteed to 100k rad(si) tested to mil-std-883, method 1019.5, condition a | Avl | RFQ |
151-105-RC | kobiconn | test points lg blu term test points lg blu term | Avl | RFQ |
ABC54705-AA | glenair inc | fiber optic test probe | Avl | RFQ |
11001 | keystone electronics | test points wh test point jack .244 x .120, .142 d ptfe insulated test jack; jack to turret; available in white, red or black insulator bushing | Avl | RFQ |
11009-B | keystone electronics | test points ptfe test point jack blk rohs non-comp teflon insulated test point jacks | Avl | RFQ |
CS5658A1 | itt corporation | hi-pot tester | Avl | RFQ |
ABC54705-GD | glenair inc | fiber optic test probe | Avl | RFQ |
TEW5009 | itt corporation | t1/cept/isdn test transformer | Avl | RFQ |
C13202101 | itt corporation | hook-up wire, pvc test lead, no. of conductors: 1, gauge size (awg): 18 | Avl | RFQ |
GTK1000-F-A | glenair inc | fiber optic testing kit | Avl | RFQ |
GTK1000-F-C | glenair inc | fiber optic testing kit | Avl | RFQ |
151-108-RC | kobiconn | test points lg grn term test points lg grn term | Avl | RFQ |
GTK1000-A-E | glenair inc | fiber optic testing kit | Avl | RFQ |
GTK1000-C-B | glenair inc | fiber optic testing kit | Avl | RFQ |
ABC54705-FE | glenair inc | fiber optic test probe | Avl | RFQ |
ABC54705-DB | glenair inc | fiber optic test probe | Avl | RFQ |
SN54ACT8990-07 | texas instruments | test-bus controllers ieee std 1149.1 (jtag) tap masters with 16-bit generic host interfaces | Avl | RFQ |
SN74ABT18245ADLRG4 | texas instruments | scan test devices with 18-bit bus transceivers | Avl | RFQ |
11012 | keystone electronics | test points wh test point jack .500 x .150, .218 d teflon insulated test point jacks | Avl | RFQ |
151-103-RC | kobiconn | test points test point lg blk test points test point lg blk | Avl | RFQ |
NIPCI-5152 | itt corporation | high-speed digitizers-optimized for automated test | Avl | RFQ |
ABC54705-EE | glenair inc | fiber optic test probe | Avl | RFQ |
ABC54705-FF | glenair inc | fiber optic test probe | Avl | RFQ |
SN54ABT8245 | texas instruments | scan test devices with octal bus transceivers | Avl | RFQ |
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