Online Quote for PAL-004 Part with NSN 5962011708174 by Bae Systems Now

Mfg Part Number: PAL-004	Alternate P/N: PAL004	Manufacturer: Bae Systems
NSN : 5962-01-170-8174	Item Name : microcircuit memory	CAGE Code : K0978
FSC : 5962 Microcircuits Electronic

Thank you for your interest in NSN Part PAL-004 of Microcircuit Memory at Automatic Aerospace. This Bae Systems manufacturer item is listed alongside with NSN 5962-01-170-8174 and part PAL-004 for your reference. As this product is currently available, we encourage you to take advantage of our Instant RFQ service in order to acquire a competitive quote for your comparisons. With 24/7x365 team member availability, responses to requests or inquiries are completed with haste.

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Explore our listings at your leisure and you will find that the part PAL-004 of NSN 5962-01-170-8174 can be found listed under CAGE Code K0978. However, we carry an array of other NSN parts, all of which have been sourced from reputable distributors like Bae Systems. Kickoff the purchasing process with a quote request that includes all of your part requirements and see how Automatic Aerospace can serve as your go-to sourcing solution. For additional questions, call or email us directly; we are on standby for our customers.

NSN Information for Part Number PAL-004 with NSN 5962-01-170-8174, 5962011708174

NSN	FSC	NIIN	CLS	Hazmat	DEMIL	Cancelled NSN
5962-01-170-8174 Item Description: Microcircuit Memory	5962	011708174	0	N	B
	CIIC	HCC	ESD	PMIC	Criticality	ENAC
	U		B	A	0
Part Number	ISC	RNVC	RNCC	HCC	MSDS	SADC
Pal-004	2	2	5

Characteristics Data of NSN 5962-01-170-8174, 5962011708174

MRC	Criteria	Characteristic
MEMORY	ADAQ	BODY LENGTH1 090 INCHES MAXIMUM
MEMORY	ADAT	BODY WIDTH0 220 INCHES MINIMUM AND 0 310 INCHES MAXIMUM
MEMORY	ADAU	BODY HEIGHT0 185 INCHES MAXIMUM
MEMORY	AFGA	OPERATING TEMP RANGE-55 0125 0 DEG CELSIUS
MEMORY	AFJQ	STORAGE TEMP RANGE-65 0150 0 DEG CELSIUS
MEMORY	CBBL	FEATURES PROVIDEDPROGRAMMABLE AND HIGH SPEED AND 3-STATE OUTPUT AND BIPOLAR AND SCHOTTKY
MEMORY	CQSJ	INCLOSURE MATERIALCERAMIC
MEMORY	CQSZ	INCLOSURE CONFIGURATIONDUAL-IN-LINE
MEMORY	CQWX	OUTPUT LOGIC FORMTRANSISTOR-TRANSISTOR LOGIC
MEMORY	CQZP	INPUT CIRCUIT PATTERN12 INPUT
MEMORY	CWSG	TERMINAL SURFACE TREATMENTSOLDER
MEMORY	CZEN	VOLTAGE RATING AND TYPE PER CHARACTERISTIC7 0 VOLTS MAXIMUM POWER SOURCE
MEMORY	CZEQ	TIME RATING PER CHACTERISTIC45 00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME LOW TO HIGH LEVEL OUTPUT
MEMORY	CZER	MEMORY DEVICE TYPEROM
MEMORY	TEST	TEST DATA DOCUMENT96906-MIL-STD-883 STANDARD INCLUDES INDUSTRY OR ASSOCIATION STANDARDS INDIVIDUAL MANUFACTUREER STANDARDS ETC
MEMORY	TTQY	TERMINAL TYPE AND QUANTITY20 PRINTED CIRCUIT