Online Quote for 13084712 Part with NSN 5962012635903 by Program Manager Advanced Attack Now

Mfg Part Number: 13084712	Manufacturer: Program Manager Advanced Attack	NSN : 5962-01-263-5903
Item Name : microcircuit memory	CAGE Code : 58260	FSC : 5962 Microcircuits Electronic

Thank you for your interest in NSN Part 13084712 of Microcircuit Memory at Automatic Aerospace. This Program Manager Advanced Attack manufacturer item is listed alongside with NSN 5962-01-263-5903 and part 13084712 for your reference. As this product is currently available, we encourage you to take advantage of our Instant RFQ service in order to acquire a competitive quote for your comparisons. With 24/7x365 team member availability, responses to requests or inquiries are completed with haste.

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Explore our listings at your leisure and you will find that the part 13084712 of NSN 5962-01-263-5903 can be found listed under CAGE Code 58260. However, we carry an array of other NSN parts, all of which have been sourced from reputable distributors like Program Manager Advanced Attack. Kickoff the purchasing process with a quote request that includes all of your part requirements and see how Automatic Aerospace can serve as your go-to sourcing solution. For additional questions, call or email us directly; we are on standby for our customers.

NSN Information for Part Number 13084712 with NSN 5962-01-263-5903, 5962012635903

NSN	FSC	NIIN	CLS	Hazmat	DEMIL	Cancelled NSN
5962-01-263-5903 Item Description: Microcircuit Memory	5962	012635903	0	N	B
	CIIC	HCC	ESD	PMIC	Criticality	ENAC
	7		B	A	0
Part Number	ISC	RNVC	RNCC	HCC	MSDS	SADC
13084712	2	1	5

Characteristics Data of NSN 5962-01-263-5903, 5962012635903

MRC	Criteria	Characteristic
ADAQ	BODY LENGTH	1.290 INCHES MAXIMUM
ADAT	BODY WIDTH	0.500 INCHES MINIMUM AND 0.610 INCHES MAXIMUM
ADAU	BODY HEIGHT	0.210 INCHES MAXIMUM
AFGA	OPERATING TEMP RANGE	-55.0/+125.0 DEG CELSIUS
AFJQ	STORAGE TEMP RANGE	-65.0/+150.0 DEG CELSIUS
CBBL	FEATURES PROVIDED	HERMETICALLY SEALED AND BURN IN AND PROGRAMMABLE AND SCHOTTKY AND W/ENABLE AND ELECTROSTATIC SENSITIVE
CQSJ	INCLOSURE MATERIAL	CERAMIC
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE
CQWX	OUTPUT LOGIC FORM	TRANSISTOR-TRANSISTOR LOGIC
CQZP	INPUT CIRCUIT PATTERN	14 INPUT
CTFT	CASE OUTLINE SOURCE AND DESIGNATOR	D-3 MIL-M-38510
CWSG	TERMINAL SURFACE TREATMENT	SOLDER
CZEN	VOLTAGE RATING AND TYPE PER CHARACTERISTIC	-0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE
CZEQ	TIME RATING PER CHACTERISTIC	50.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 50.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
CZER	MEMORY DEVICE TYPE	ROM
TEST	TEST DATA DOCUMENT	96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
TTQY	TERMINAL TYPE AND QUANTITY	24 PRINTED CIRCUIT